Cryo UHV STM AFM

Description

Based on the field-proven “Johnny Walker” Beetle™ design, RHK’s VT Beetle is the most mechanically and thermally stable of the many variable temperature SPM designs on the market today.

Wide VT operation from 25 K (LHe) to 1500 K is coupled with easily aligned AFM enabling a full range of techniques from advanced NC-AFM to true quantitative friction force measurements. The user can easily switch between STM and AFM in UHV, and exchange and store samples, tips, and probes in UHV. The Beetle is available in a variety of configurations from kits for atmospheric operation to complete variable temperature systems. Specialized Beetle systems from RHK provide Variable Magnetic Fields, specialized Optical access for many optical beam studies, and SEM-guided probe positioning. The Beetle can be integrated with RHK’s prep-analysis chambers for a multi-technique nanotech research platform whose performance and capabilities are unmatched.

Beetle UHV VT AFM Overview

Based on the field-proven “Johnny Walker” Beetle™ design, RHK’s VT Beetle is the most mechanically and thermally stable of the many variable temperature SPM designs on the market today. Wide VT operation from 25 K (LHe) to 1500 K, the Beetle AFM/STM systems are based on the traditional laser deflection – position sensitive detection (PSD) feedback design. This provides the full range of AFM acquisition modes including; Normal Force, Lateral Force, Non-Contact, Near Contact, Constant Height, CAFM, MFM, simultaneous AFM/STM, and more. The Beetle AFM includes standard commercial cantilever mounts and standard STM tip wire mounts with in vacuum storage and in-situ exchange for easy cantilever and/or tip exchange without breaking the vacuum. The open exchange holders also provide for in-situ thermal and ion beam tip conditioning.

Beetle STM Quick Specifications

• Straightforward laser path without mirrors or lenses
• Intuitive orthogonal laser and PSD alignment
• True quantitative friction force measurements
• Coarse XY positioning at least 5 mm x 5 mm
• Scan range of at least 5 micron x 5 micron XY
• Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z)
• Thermal drift <1 Å/min
• Sample temperatures: from 25 K (LHe) to >1500 K; or 100 K (LN2) to >1500 K
• Sample size 10mm diameter

Beetle UHV VT AFM Specifics

• Inherent Mechanical and Thermal Stability due to small mechanical and thermal loop, inherently stiff and compact Beetle design, and symmetrical geometry. Thermal drift <1 Å/min
• Easy day-to-day use without frustration of others’ more complex and less intuitive approach
• Simple, direct line of sight laser positioning on cantilever with X and Y motors
• Simple, direct line of sight PSD positioning to reflected laser spot with X and Y motors
• Simple optical path, without mirrors or lenses
• Easy to adjust to center of PSD
• True quantitative lateral force (LFM and nanotribilogy) measurements can be made
• Optical pathway adjusts on both the cantilever and detector, allowing nulling of both normal and lateral force signals.
• Heating samples has no impact on Scan Tube, eliminating danger of affecting its thermal coefficient and causing drift
• Beetle design scans more quickly than sample scanners due to fewer restrictions on resonant frequency
• Coarse XY positioning at least 5 mm x 5 mm
• Scan range of at least 5 micron x 5 micron XY
• Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z).
• Thermal drift <1 Å/min
• Sample temperatures: from 25 K (LHe) to >1500 K; or 100 K (LN2) to >1500 K
• Beetle sample holder uniquely provides true and accurate sample temperature measurement via thermocouple in direct contact with sample itself.
• Sample temperatures from 25 K to >1500 K on SPM sample stage and on manipulator stages in preparation/analysis chambers
• Sample temperature while imaging: 1000 K for AFM (with new Therma AFM), 1000 K for STM
• 6 electrical contacts to sample holder (2 for temperature, 2 for heating, 2 for auxiliary use such as BEEM). A single holder conveniently supports all heating and cooling modes – radiative, e-beam, resistive/DC; LN2 and LHe
• Sample holders also available for Cleaving; delivering RF signal to sample; and heating in reactive gases via Quartz Bulb or Ceramic Button
• Sample size 10mm diameter

Beetle UHV VT VMF Overview

RHK’s VT Beetle is the most mechanically and thermally stable of the many variable temperature SPM designs on the market today. Wide VT operation of the Beetle from approx. 40 K (LHe) to >1500 K is coupled with easily aligned AFM enabling a full range of techniques from advanced NC-AFM to true quantitative friction force measurements. The user can easily switch between STM and AFM in UHV, and exchange and store samples, tips, and probes in UHV.

Now RHK brings affordable magnetic capability with uncompromised UHV AFM/STM VT performance. Equipped with a UHV SPM Variable Magnetic Field at a fraction of the cost of a typical system, RHK’s new VMF Beetle delivers a magnetic field in plane with the sample and variable/reversible to 3000 Gauss and beyond. Its unique electromagnet design delivers a reversible and continuously variable field up to 1 Tesla (option) in plane with a sample size of 1 cm. Out of plane magnetic field is also available. The field can be varied real-time while imaging without retracting the probe from the sample. And its smart design means that ex-vacuum convectional electromagnets require no cooling.

Five Key Features of the Beetle UHV VMF SPM:

1. Ability to vary the magnetic field while imaging in real-time without retracting the probe.
2. Over 3000 gauss and higher in plane with sample size of 1 cm. Options for a vertical magnet field are available.
3. Electromagnets provide reversible and continuously variable field.
4. Easily reproducible field strength across multiple samples and runs.
5. No compromise in resolution, drift, stability, and vibration isolation.

Beetle UHV VT VMF Specifics

• Inherent Mechanical and Thermal Stability due to small mechanical and thermal loop, inherently stiff and compact Beetle design, and symmetrical geometry. Thermal drift <1 Å/min
• Easy day-to-day use without frustration of others’ more complex and less intuitive approach
• Strong Field: Up to 1T magnetic field in sample plane
• Options: Out of plane magnetic field available
• Smart Design: Ex-vacuum convectional electromagnets require no cooling and provide continuously variable & reversible fields
• No Compromise: In SPM resolution, drift, or stability
• Heating samples has no impact on Scan Tube, eliminating danger of affecting its thermal coefficient and causing drift
• Beetle design scans more quickly than sample scanners due to fewer restrictions on resonant frequency
• Coarse XY positioning at least 5 mm x 5 mm
• Scan range of at least 5 micron x 5 micron XY
• Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z).
• Thermal drift <1 Å/min
• Sample temperatures: from approx 40 K (LHe) / 115 K (LN2) to >1500 K
• Beetle sample holder uniquely provides true and accurate sample temperature measurement via thermocouple in direct contact with sample itself.
• Sample temperatures from 25 K to >1500 K on SPM sample stage and on manipulator stages in preparation/analysis chambers
• Sample temperature while imaging: 750 K for AFM, 1000 K for STM
• 6 electrical contacts to sample holder (2 for temperature, 2 for heating, 2 for auxiliary use such as BEEM). A single holder conveniently supports all heating and cooling modes – radiative, e-beam, resistive/DC; LN2 and LHe
• Sample holders also available for Cleaving; delivering RF signal to sample; and heating in reactive gases via Quartz Bulb or Ceramic Button
• Sample size 10mm diameter

Beetle UHV VT AFM/SEM Overview

How Do You Bridge the Gap Between Resolution and Field of View?

A 100 nm particle sounds vast in our nano-research world. But searching for a feature even that size on a 10-20 mm2 SPM sample can be futile. It is far too small for optical imaging to assist navigation, and scanning with an SPM can waste valuable research time. How do you bridge the gap between optical and SPM techniques to assure productive results? RHK Provides the Solution: Meet the UHV Probe Positioning System. Swift SEM-guided probe placement in a wide field of view, integrated with uncompromised AFM/STM resolution.

RHK puts your Science On Target.

A fully integrated SEM onboard our renowned UHV AFM/STM. Best-of-breed analytical and preparation instruments are thoughtfully configured and integrated across hardware, software, electrical, and control interfaces.

• Integrated SEM for Swift, Efficient Probe Positioning
• Uncompromised AFM and STM Performance
• Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
• VT Extremes from 25 K to 1500 K
• Highly Evolved SPM Control System
• Modular Analytical and Sample Preparation Options

Beetle UHV VT AFM/SEM Specifics

• Inherent Mechanical and Thermal Stability due to small mechanical and thermal loop, inherently stiff and compact Beetle design, and symmetrical geometry. Thermal drift <1 Å/min
• Easy day-to-day use without frustration of others’ more complex and less intuitive approach
• Integrated SEM for Swift, Efficient Probe Positioning
• Uncompromised AFM and STM Performance
• Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
• VT Extremes from 25 K to 1500 K
• Highly Evolved SPM Control System
• Modular Analytical and Sample Preparation Options
• Coarse XY positioning at least 5 mm x 5 mm
• Scan range of at least 5 micron x 5 micron XY
• Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z).
• Thermal drift <1 Å/min
• Sample temperatures: from 25 K (LHe) to >1500 K; or 100 K (LN2) to >1500 K
• Beetle sample holder uniquely provides true and accurate sample temperature measurement via thermocouple in direct contact with sample itself.
• Sample temperatures from 25 K to >1500 K on SPM sample stage and on manipulator stages in preparation/analysis chambers
• Sample temperature while imaging: 750 K for AFM, 1000 K for STM
• 6 electrical contacts to sample holder (2 for temperature, 2 for heating, 2 for auxiliary use such as BEEM). A single holder conveniently supports all heating and cooling modes – radiative, e-beam, resistive/DC; LN2 and LHe
• Sample holders also available for Cleaving; delivering RF signal to sample; and heating in reactive gases via Quartz Bulb or Ceramic Button
• Sample size 10mm diameter

Beetle Ambient STM/AFM Overview

At the intersection of performance and affordability for benchtop, glovebox, or ultimately moving to HV or UHV, Beetle Ambient Systems are a perfect beginning. RHK’s ATM (Atmospheric) Beetles provide a unique instrument solution for researchers. The Beetle ATM series offers users a true state-of-the-art SPM instrument that is completely UHV compatible. No other instrument provides this level of functionality with unlimited upgradeability.

Features

• Dedicated STM or Beam-Deflection-AFM/STM models available for Beetle Ambient Systems
• Beetle Scanner Design – Unmatched thermal stability. Scan the same area of a sample repeatedly without drifting
• R9plus Controller – The world’s standard in control flexibility and performance
• Convenient Lexan and frame enclosure for easy bench top or air table use.
• Open Design – Optical access to tip/sample interface
• UHV materials and construction

Beetle Ambient STM/AFM Specifics

• Inherent Mechanical and Thermal Stability due to small mechanical and thermal loop, inherently stiff and compact Beetle design, and symmetrical geometry.
• Easy day-to-day use without frustration of others’ more complex and less intuitive approach
• Uncompromised AFM (Beam Deflection) and STM Performance
• Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
• Highly Evolved R9plus SPM Control System
• Coarse XY positioning at least 5 mm x 5 mm
• Scan range of at least 5 micron x 5 micron XY
• Minimum resolution of 0.5Å (X, Y) and 0.1Å (Z).
• Thermal drift <1 Å/min
• Sample size 10mm diameter
• Direct upgrade path from ambient Kits to Hi-Vac or UHV complete systems

Prep/Analysis Equipment Overview

To complement all of RHK’s advanced UHV AFM/STM SPM systems, preparation and analysis equipment can be added and integrated to create complete and versatile surface science platforms.Quadraprobe, Panscan

RHK SPMs are thoughtfully designed from the beginning for easy modular upgrades over time as funding permits and research evolves. Adding RHK prep-analysis chambers and instruments brings powerful new research capabilities to SPM systems and greatly increases overall functionality.

RHK tailors prep/analysis upgrades to individual user needs and preferences without restricting the choice to a particular brand of instrument. Instead, RHK works with several close industry partners to select specialized best-in-class instruments such as LEED, XPS, SEM, evaporators, and ion sources. Our approach assures the user’s requirements are met without compromise or trade-offs.

An RHK prep/analysis chamber is chosen to accommodate the selected instruments. The chamber can be one of several pre-designed configurations or completely customized for unique research objectives. Then these instruments and chamber are fully integrated with the SPM system, and the complete platform is thoroughly tested, delivered, and installed.

RHK can also install a prep-analysis chamber and instrument upgrade for an existing SPM system at the customer’s site, so the original system never has to leave the laboratory. In either case, the result is a complete system with seamless, turnkey operation, advanced functionality, and ongoing support.

Prep/Analysis Chamber Design

All RHK prep/analysis chambers share these design elements:

• Equipped with best-in-class instruments from select suppliers to assure maximum performance of each piece of equipment
• Fabricated with UHV-grade Stainless Steel (mu-metal available); multiple flanges, viewports, and spares of different sizes to allow mounting of additional instruments in the future
• Are fully customizable during the design phase
• Are fully integrated into the overall system
• Can be installed at RHK during SPM system construction or later on-site in the customer lab
• Fully isolated from the adjoining SPM chamber and load lock via gate valves
• Equipped with dedicated UHV pumping and gauge packages
• Can be vented independently of other system chambers
• Fully bakeable with the SPM system, or independently bakeable with additional equipment
• Provide easy, direct transfer in UHV among all adjoining chambers
• Outfitted with their own transfer arms or sample manipulators
• Depending on chamber and manipulator model, equipped with sample cooling, heating, electrical contacts, and movement in XYZ and rotation to take full advantage of all instruments and applications

RHK Typical Prep/Analysis Chambers

RHK provides four typical chamber models for Beetle and PanScan SPM, plus a wide-open set of features for customization. RHK’s QuadraProbe prep/analysis chamber is also customizable; its lay-out is exclusively set up for the special requirements of a 4-Probe LT system.

Three typical chamber configurations for PanScan and Beetle:

Basic Plus

Standard

Advanced

Ranging from basic to advanced, these standardized Beetle and PanScan prep chamber configurations accelerate the process of selection, design, and fabrication, help reduce costs, and satisfy the widest range of needs. Each has its own set of features and capabilities. All have the chamber design elements described above.

RHK Customized Prep/Analysis Chambers

When none of the four typical configurations meet a user’s most demanding requirements — even with customization — RHK develops and designs a unique prep/analysis chamber exactingly tailored to special applications.

• Equipped with best-in-class instruments from select suppliers to assure maximum performance of each piece of equipment
• Fabricated with UHV-grade Stainless Steel (mu-metal available); multiple flanges, viewports, and spares of different sizes to allow mounting of additional instruments in the future
• Are fully customizable during the design phase
• Are fully integrated into the overall system
• Can be installed at RHK during SPM system construction or later on-site in the customer lab
• Fully isolated from the adjoining SPM chamber and load lock via gate valves
• Equipped with dedicated UHV pumping and gauge packages
• Can be vented independently of other system chambers
• Fully bakeable with the SPM system, or independently bakeable with additional equipment
• Provide easy, direct transfer in UHV among all adjoining chambers
• Outfitted with their own transfer arms or sample manipulators
• Depending on chamber and manipulator model, equipped with sample cooling, heating, electrical contacts, and movement in XYZ and rotation to take full advantage of all instruments and applications

Four-chamber systems

For situations where analysis chamber equipment could be at risk of contamination by certain preparation and deposition films, an RHK Four-Chamber design provides the necessary safeguards. An isolated SPM, load lock, clean analysis chamber, and dirty preparation chamber are integrated into a research platform with highly advanced capabilities and sample transfer for travel throughout the entire system.

Optimization for Specialized Applications

RHK developed an extremely cost-effective and unique design that provides a highly compact, versatile system enabled for multi-angle IR beam studies plus Thermal Program Desorption (TPD). RHK’s elegant design approach allowed for a shorter travel XYZR manipulator to reduce costs without compromising performance of either technique. Wide-range heating, cooling, and accurate sample surface temperature measurement for TPD were combined with precisely positioned sample access to all necessary angles for IR studies.

Preparation chamber: customized for LEED/Auger, sputter ion gun, MBE K-cell, H2 cracker, and numerous spare ports for future expansion capability. System also contains a load lock and manipulator with sample heating (radiative, resistive, and e-beam modes) and LN2 cooling. STM chamber contains a metal evaporator for in-situ evaporation. Frame has space for additional chamber with independent pumping for future expansion.

RHK has a long and proud history of accomplishment in SPM Control. With over 1,000 controllers installed around the world, RHK has brought a continual series of advanced capabilities to the nanotechnology field for decades. From the early days of STM, to contact AFM, then NC-AFM, through the transition to digital electronics, and on to new paradigms for graphical interface ease of use and total hardware integration, RHK control platforms consistently bring powerful new functionality to researchers worldwide.