Products - Surface Material Science


Advanced Metrology Products and Solutions
AFM
Confocal RAMAN and Ultrafast Spectroscopy
Contact Angle, Surface Tension and friction measurement system
CVD
LEEM, XPEEM, PEEM, SPELEEM, SPLEEM, LEED
Magneto-Optical KERR Microscope
Mask Aligner, Spin Coater and Nano imprint Lithography
MBE/ PVD/ PLD / ALD / RTP
PERIE / PECVD
SAXS/ SWAXS
Sputtering Systems/  Evaporation system
UHV and Cryogenic Scanning Probe Microscopes
UHV STM/ SPM/ CAFM
UHV Systems XPS/ UPS/ ARPES